Analysis and modeling of low-frequency noise in resistive FET mixers

IEEE Transactions on Microwave Theory and Techniques

Volumn 52, Issue 7, 2004, Pages 1709-1718

  Margraf, Michael ^a   Boeck, Georg ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Cold field effect transistor (FET); Flicker noise; High electron mobility transistor (HEMT); Noise model; Resistive mixer

Indexed keywords

CHARGE CARRIERS; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; MIXER CIRCUITS; RELAXATION PROCESSES; SPURIOUS SIGNAL NOISE;

COLD FIELD EFFECT TRANSISTORS; FLICKER NOISE; NOISE MODELS; RESISTIVE MIXERS;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 3142655790     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.830486     Document Type: Article

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