Scaling of Low-Frequency Noise in Resistive FET Mixers

SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings

Volumn , Issue , 2003, Pages 873-876

  Margraf, Michael ^a   Boeck, Georg ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER AIDED ENGINEERING; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; FIELD EFFECT TRANSISTORS; FREQUENCIES; MIXER CIRCUITS; SPURIOUS SIGNAL NOISE;

GATE LOAD RESISTANCE; LOCAL OSCILLATORS (LO);

MOBILE TELECOMMUNICATION SYSTEMS;

EID: 1642305742     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. S. Mass, Mixer Technologies for Modern Microwave and Wireless Systems, GAAS 2002 Conf., Milan 2002.
2. F. N. Hooge, 1/f Noise Sources, IEEE Trans. Electron Devices, vol. 41, no. 11, pp. 1926-1935, November 1994.
3. M. Margraf, G. Boeck, A New Scaleable Low Frequency Noise Model for Field-Effect Transistors Used in Resistive Mixers, IMS 2003.
4. M. Margraf, G. Boeck, Determination of Flicker Noise Sources in Resistive FET-Mixers, previously unpublished, handed in for IEEE Microwave and Wireless Components Letter.
5. M. Margraf, G. Boeck, 1/f Noise Optimum for Field-Effect Transistors in Single-Ended Resistive Mixers, previously unpublished, handed in for EuMW 2003.
6. P. H. Ladbrooke, MMIC Design: GaAs FETs and HEMTs, Artech House, Inc., 1989, pp. 205-219.