A new scaleable low frequency noise model for field-effect transistors used in resistive mixers

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2003, Pages 559-562

  Margraf, Michael ^a   Boeck, Georg ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; HIGH ELECTRON MOBILITY TRANSISTORS; MESFET DEVICES; SPURIOUS SIGNAL NOISE;

PHASE NOISE;

MOSFET DEVICES;

EID: 0042164470     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

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