Scanning tunneling spectroscopy examination of surface electronic structures of Si(111) (2√3 × 2√3) 30°-Sn surface

Applied Surface Science

Volumn 104-105, Issue , 1996, Pages 223-227

  Lin, X F ^a   Chizhov, I ^a   Mai, H A ^a   Willis, R F ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COATINGS; ELECTRONIC STRUCTURE; FERMI LEVEL; SCANNING TUNNELING MICROSCOPY; SPECTRUM ANALYSIS; SURFACE STRUCTURE; TIN;

SEMICONDUCTING SILICON;

EID: 0030235808     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00148-1     Document Type: Article

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