An accurate current source with on-chip self-calibration circuits for low-voltage current-mode differential drivers

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 53, Issue 1, 2006, Pages 40-47

  Zhang, Guangbin ^a,b   Saw, Sooping ^a,c   Liu, Jin ^a   Sterrantino, Scott ^d   Johnson, David K ^d   Jung, Sungyong ^e  

^a The University of Texas at Dallas   (United States)

^b OmniVision Technologies Inc   (United States)

^c STMICROELECTRONICS   (Italy)

^d TEXAS INSTRUMENTS   (United States)

^e University of Texas at Arlington   (United States)

Author keywords

Built in self measurement; CMOS integrated circuits; Current mode transmitter driver; Low voltage; Self calibration

Indexed keywords

BUILT-IN SELF TEST; CALIBRATION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE;

BUILT-IN SELF-MEASUREMENT; CURRENT-MODE TRANSMITTER DRIVER; SELF-CALIBRATION;

CMOS INTEGRATED CIRCUITS;

EID: 31344433724     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2005.855726     Document Type: Article

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