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Applied Surface Science

Volumn 164, Issue 1-4, 2000, Pages 169-174

STM studies: Spatial resolution limits to fit observations in nanotechnology

(7) Szkutnik, Pierre David a Piednoir, Agnès a Ronda, Antoine a Marchi, Florence b Tonneau, Didier b Dallaporta, Hervé b Hanbücken, Margrit a

a CAMPUS DE LUMINY (France)

b Campus Luminy (France)

Author keywords

Nanotechnology; Spatial resolution limits; STM

Indexed keywords

EID: 0034276418 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(00)00337-8 Document Type: Article

Times cited : (10)

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- accepted
- F. Marchi, D. Tonneau, H. Dallaporta, V.I. Safarov, V. Bouchiat, P. Doppelt, R. Even, L. Beitone, J. Vac. Sci. Technol., B (2000) accepted.
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