Submicron patterning of iron nanoparticle monolayers for carbon nanotube growth

Chemistry of Materials

Volumn 17, Issue 2, 2005, Pages 237-241

  Wong, Eric W ^a   Bronikowski, Michael J ^a   Hoenk, Michael E ^a   Kowalczyk, Robert S ^a   Hunt, Brian D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CATALYSIS; CHEMICAL VAPOR DEPOSITION; COLLOIDS; HIGH TEMPERATURE EFFECTS; IRON; NANOSTRUCTURED MATERIALS; SINTERING;

IRON NANOPARTICLES (FENP); NANOTUBE GROWTH; SINGLE-WALLED CARBON NANOTUBES (SWNT); SUBMICRON PATTERNING;

MONOLAYERS;

CARBON NANOTUBE; IRON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CATALYSIS; CATALYST; COLLOID; HIGH TEMPERATURE; METHODOLOGY; NANOPARTICLE; NANOTUBE; PARTICLE SIZE; REDUCTION; TEMPERATURE DEPENDENCE; VAPOR;

EID: 12344318988     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm048795m     Document Type: Article

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25. The solution is stable for over 9 months but is made unstable by further dilution in hexane. The dried FeNPs could be easily re-dispersed in hexane and used for SWNT growth after two years.
26. PMMA that was photopatterned via a top layer of AZ5214 resulted in clean liftoff only after completely removing the AZ5214 after defining the holes in the PMMA. Removal of the AZ5214 top layer was not necessary if a 15-nm titanium layer separated the bottom PMMA and top AZ5214. In this case, the titanium layer came off as a single sheet, thereby removing residual FeNPs. However, liftoff using the Ti barrier layers was only reliable for isolated dots and not closely spaced arrays.
27. For the particle counts of growths 1 and 2 and heights of ∼5 and 4 nm, respectively, one expects the widths to be ∼13 and ∼36 nm, respectively, assuming an initial particle count of 10 000 before heating.