Secondary electron imaging of nonconductors with nanometer resolution

Applied Physics Letters

Volumn 88, Issue 2, 2006, Pages 1-3

  Toth, Milos ^a   Knowles, W Ralph ^a   Thiel, Bradley L ^b  

^a Thermo Fisher Scientific   (United States)

^b STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH VACUUM SEM; MAGNETIC IMMERSION; NANOMETER RESOLUTION; SE IMAGING SIGNAL; SECONDARY ELECTRON (SE) IMAGES; SELF-REGULATION;

CHARGING (BATTERIES); DIFFUSION IN SOLIDS; ELECTRIC CONDUCTORS; ELECTRON LENSES; IONIZATION OF GASES; MAGNETIC FIELD EFFECTS; SCANNING ELECTRON MICROSCOPY;

MAGNETIC RESONANCE IMAGING;

EID: 30744436809     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2161571     Document Type: Article

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