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Volumn 109, Issue 50, 2005, Pages 23918-23924

Studies of tetracene- and pentacene-based organic thin-film transistors fabricated by the neutral cluster beam deposition method

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MOLECULAR DYNAMICS; MORPHOLOGY; SILICA; THIN FILM TRANSISTORS; X RAY DIFFRACTION ANALYSIS;

EID: 30544444194     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp054894r     Document Type: Article
Times cited : (57)

References (40)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.