Characterization of polyaniline thin films prepared by cluster beam deposition methods

Synthetic Metals

Volumn 135-136, Issue , 2003, Pages 81-82

  Lim, H ^a   Kim, B J ^a   Choi, J H ^a  

^a Korea University   (South Korea)

Author keywords

Atomic force microscopy; Cluster beam deposition; Polyaniline thin film; UV visible absorption spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; DEPOSITION; ELECTRODES; ELECTRONS; IONIZATION; STRUCTURE (COMPOSITION); THIN FILMS; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

CLUSTER BEAM DEPOSITION; EMERALDINE STATE; POLYANILINE THIN FILMS; UV-VISIBLE ABSORPTION SPECTROSCOPY;

NITROGEN COMPOUNDS;

EID: 23044441536     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(02)00568-4     Document Type: Conference Paper

References (4)

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