Multiple relaxation mechanisms in SiTiO 3/SrRuO 3 heterostructures

Applied Physics Letters

Volumn 84, Issue 24, 2004, Pages 4848-4850

  Ban, Z G ^a   Alpay, S P ^a   He, Feizhou ^a   Wells, B O ^a   Xi, X X ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; MULTIPLE RELAXATION; POLYDOMAIN STRUCTURES; STRESS LEVELS;

CORROSION; EPITAXIAL GROWTH; HETEROJUNCTIONS; INTERFACES (MATERIALS); PARAMETER ESTIMATION; PHASE TRANSITIONS; PHOTONS; STRESS RELAXATION; THERMAL EXPANSION; X RAY DIFFRACTION;

STRONTIUM COMPOUNDS;

EID: 3042856287     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1760228     Document Type: Article

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