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Journal of Applied Physics

Volumn 92, Issue 10, 2002, Pages 6149-6152

Effects of buffer layer thickness and strain on the dielectric properties of epitaxial SrTiO 3 thin films

(2) James, A R a Xi, X X a

a PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYER THICKNESS; DIELECTRIC BEHAVIOR; DIELECTRIC MEASUREMENTS; DIFFERENT SUBSTRATES; HIGH-TEMPERATURE DEPOSITION; SRTIO; STO FILMS; TUNABILITIES;

BUFFER LAYERS; EPITAXIAL GROWTH; STRAIN; STRONTIUM TITANATES; THIN FILMS; VAPOR DEPOSITION;

DIELECTRIC PROPERTIES;

EID: 0037112976 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1515100 Document Type: Article

Times cited : (26)

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