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Applied Physics Letters

Volumn 84, Issue 22, 2004, Pages 4505-4507

Dielectric characterization of Bi3.25La0.75Ti 3O12 thin films

(3) Wu, Di a Li, Aidong a Ming, Naiben a

a NANJING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITORS; CHARGE CARRIERS; DIELECTRIC LOSSES; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; FERROELECTRIC THIN FILMS; GRAIN BOUNDARIES; OPTIMIZATION; OXYGEN; PERMITTIVITY; PEROVSKITE; PHASE TRANSITIONS; POLARIZATION;

FATIGUE RESISTANCE; IMPEDANCE SPECTROSCOPY; PYROELECTRIC DEVICES; REMANENT POLARIZATION;

BISMUTH COMPOUNDS;

EID: 3042823810 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1757631 Document Type: Article

Times cited : (70)

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