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Volumn 16, Issue 11, 2001, Pages 3124-3132
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Formation and characteristics of highly c-axis-oriented Bi3.25La0.75Ti3O12 thin films on Sio2/Si(100) and Pt/Ti/SiO2/Si(100) substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH COMPOUNDS;
COERCIVE FORCE;
FILM GROWTH;
IONS;
MOLECULAR ORIENTATION;
PEROVSKITE;
POLARIZATION;
REMANENCE;
SILICA;
SUBSTRATES;
REMANENT POLARIZATION;
THIN FILMS;
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EID: 0035521910
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2001.0431 Document Type: Article |
Times cited : (36)
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References (28)
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