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Volumn , Issue , 2004, Pages 13-16

A mold and transfer technique for lead-free fluxless soldering and application to wafer-level low-temperature thin-film packages

Author keywords

[No Author keywords available]

Indexed keywords

LOW-TEMPERATURE THIN-FILM PACKAGES; PIRANI GAUGES; SOLDER BALLS; WET LITHOGRAPHY;

EID: 3042780176     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (11)
  • 1
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    • Heidelberg, Germany
    • C. T. Nguyen, "Microelectromechanical devices for wireless communications," Proceedings of MEMS '98, Heidelberg, Germany, pp. 1-7, 1998.
    • (1998) Proceedings of MEMS '98 , pp. 1-7
    • Nguyen, C.T.1
  • 2
    • 0035368205 scopus 로고    scopus 로고
    • A HARPSS polysilicon vibrating ring gyroscope
    • F. Ayazi, et al., "A HARPSS polysilicon vibrating ring gyroscope," JMEMS, vol. 10, pp. 169-179, 2001.
    • (2001) JMEMS , vol.10 , pp. 169-179
    • Ayazi, F.1
  • 3
    • 85089828737 scopus 로고    scopus 로고
    • An integrated process for post-packaging release and vacuum sealing of electroplated nickel packages
    • Boston, MA
    • B. H. Stark, et al., "An Integrated Process for Post-Packaging Release and Vacuum Sealing of Electroplated Nickel Packages," Proceedings of Transducers '03, Boston, MA, pp. 1911-4, 2003.
    • (2003) Proceedings of Transducers '03 , pp. 1911-1914
    • Stark, B.H.1
  • 4
    • 0033747819 scopus 로고    scopus 로고
    • Lead-free solders in microelectronics
    • M. Abtew, et al., "Lead-free Solders in Microelectronics," Material Science and Engineering, vol. 27, pp. 95-141, 2000.
    • (2000) Material Science and Engineering , vol.27 , pp. 95-141
    • Abtew, M.1
  • 5
    • 0038351731 scopus 로고    scopus 로고
    • Reliability of the Pb-free solder bump on electroless Ni under bump metallurgies
    • N. S. Kim, et al., "Reliability of the Pb-free solder bump on electroless Ni under bump metallurgies," Proceedings of ECTC, pp. 77-82, 2003.
    • (2003) Proceedings of ECTC , pp. 77-82
    • Kim, N.S.1
  • 6
    • 0038155575 scopus 로고    scopus 로고
    • A doubly anchored surface micromachined pirani gauge for vacuum package characterization
    • Kyoto, Japan
    • B. H. Stark, et al., "A Doubly Anchored Surface Micromachined Pirani Gauge for Vacuum Package Characterization," Proceedings MEMS 2003, Kyoto, Japan, pp. 506-9, 2003.
    • (2003) Proceedings MEMS 2003 , pp. 506-509
    • Stark, B.H.1
  • 7
    • 0005041594 scopus 로고    scopus 로고
    • Accelerated testing in microelectronics: Review, pitfalls, and new developments
    • Israel
    • A. Katz, et al., "Accelerated Testing in Microelectronics: Review, Pitfalls, and New Developments," Proceedings of IMAPS, Israel, pp. 2000.
    • Proceedings of IMAPS , pp. 2000
    • Katz, A.1
  • 8
    • 0036297073 scopus 로고    scopus 로고
    • Advanced moisture diffusion modeling & characterization for electronic packaging
    • E. H. Wong, et al., "Advanced moisture diffusion modeling & characterization for electronic packaging," Proceedings of the ECTC, pp. 1297-1303, 2002.
    • (2002) Proceedings of the ECTC , pp. 1297-1303
    • Wong, E.H.1
  • 10
    • 0035439715 scopus 로고    scopus 로고
    • A hermetic glass-silicon package formed using localized aluminum/silicon-glass bonding
    • Y. T. Cheng, et al., "A Hermetic Glass-Silicon Package Formed Using Localized Aluminum/Silicon-Glass Bonding," JMEMS, vol. 10, pp. 392-9, 2001.
    • (2001) JMEMS , vol.10 , pp. 392-399
    • Cheng, Y.T.1
  • 11
    • 0035880220 scopus 로고    scopus 로고
    • Hermetic wafer bonding based on rapid thermal processing
    • M. Chiao, et al., "Hermetic wafer bonding based on rapid thermal processing," Sensors and Actuators, A: Physical, vol. 91, pp. 398-402, 2001.
    • (2001) Sensors and Actuators, A: Physical , vol.91 , pp. 398-402
    • Chiao, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.