-
1
-
-
0031650480
-
Microelectromechanical devices for wireless communications
-
Heidelberg, Germany
-
C. T. Nguyen, "Microelectromechanical devices for wireless communications," Proceedings of MEMS '98, Heidelberg, Germany, pp. 1-7, 1998.
-
(1998)
Proceedings of MEMS '98
, pp. 1-7
-
-
Nguyen, C.T.1
-
2
-
-
0035368205
-
A HARPSS polysilicon vibrating ring gyroscope
-
F. Ayazi, et al., "A HARPSS polysilicon vibrating ring gyroscope," JMEMS, vol. 10, pp. 169-179, 2001.
-
(2001)
JMEMS
, vol.10
, pp. 169-179
-
-
Ayazi, F.1
-
3
-
-
85089828737
-
An integrated process for post-packaging release and vacuum sealing of electroplated nickel packages
-
Boston, MA
-
B. H. Stark, et al., "An Integrated Process for Post-Packaging Release and Vacuum Sealing of Electroplated Nickel Packages," Proceedings of Transducers '03, Boston, MA, pp. 1911-4, 2003.
-
(2003)
Proceedings of Transducers '03
, pp. 1911-1914
-
-
Stark, B.H.1
-
4
-
-
0033747819
-
Lead-free solders in microelectronics
-
M. Abtew, et al., "Lead-free Solders in Microelectronics," Material Science and Engineering, vol. 27, pp. 95-141, 2000.
-
(2000)
Material Science and Engineering
, vol.27
, pp. 95-141
-
-
Abtew, M.1
-
5
-
-
0038351731
-
Reliability of the Pb-free solder bump on electroless Ni under bump metallurgies
-
N. S. Kim, et al., "Reliability of the Pb-free solder bump on electroless Ni under bump metallurgies," Proceedings of ECTC, pp. 77-82, 2003.
-
(2003)
Proceedings of ECTC
, pp. 77-82
-
-
Kim, N.S.1
-
6
-
-
0038155575
-
A doubly anchored surface micromachined pirani gauge for vacuum package characterization
-
Kyoto, Japan
-
B. H. Stark, et al., "A Doubly Anchored Surface Micromachined Pirani Gauge for Vacuum Package Characterization," Proceedings MEMS 2003, Kyoto, Japan, pp. 506-9, 2003.
-
(2003)
Proceedings MEMS 2003
, pp. 506-509
-
-
Stark, B.H.1
-
7
-
-
0005041594
-
Accelerated testing in microelectronics: Review, pitfalls, and new developments
-
Israel
-
A. Katz, et al., "Accelerated Testing in Microelectronics: Review, Pitfalls, and New Developments," Proceedings of IMAPS, Israel, pp. 2000.
-
Proceedings of IMAPS
, pp. 2000
-
-
Katz, A.1
-
8
-
-
0036297073
-
Advanced moisture diffusion modeling & characterization for electronic packaging
-
E. H. Wong, et al., "Advanced moisture diffusion modeling & characterization for electronic packaging," Proceedings of the ECTC, pp. 1297-1303, 2002.
-
(2002)
Proceedings of the ECTC
, pp. 1297-1303
-
-
Wong, E.H.1
-
9
-
-
0027813193
-
Reliability of postmolded IC packages
-
L. T. Nguyen, "Reliability of postmolded IC packages," Journal of Electronic Packaging, Transactions of the ASME, vol. 115, pp. 346-355, 1993.
-
(1993)
Journal of Electronic Packaging, Transactions of the ASME
, vol.115
, pp. 346-355
-
-
Nguyen, L.T.1
-
10
-
-
0035439715
-
A hermetic glass-silicon package formed using localized aluminum/silicon-glass bonding
-
Y. T. Cheng, et al., "A Hermetic Glass-Silicon Package Formed Using Localized Aluminum/Silicon-Glass Bonding," JMEMS, vol. 10, pp. 392-9, 2001.
-
(2001)
JMEMS
, vol.10
, pp. 392-399
-
-
Cheng, Y.T.1
-
11
-
-
0035880220
-
Hermetic wafer bonding based on rapid thermal processing
-
M. Chiao, et al., "Hermetic wafer bonding based on rapid thermal processing," Sensors and Actuators, A: Physical, vol. 91, pp. 398-402, 2001.
-
(2001)
Sensors and Actuators, A: Physical
, vol.91
, pp. 398-402
-
-
Chiao, M.1
|