On the correlation between grain-boundary segregation, faceting and embrittlement in Bi-doped Cu

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 82, Issue 8, 2002, Pages 1595-1608

  Stgle, W ^a   Chang, L S ^b   Gus, W ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BISMUTH; COPPER; DOPING (ADDITIVES); EMBRITTLEMENT; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; SCANNING ELECTRON MICROSCOPY; SEGREGATION (METALLOGRAPHY); TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

BRIDGMAN TECHNIQUE; FACETING; GRAIN BOUNDARY SEGREGATION; LOW INDEX PLANES;

POLYCRYSTALLINE MATERIALS;

EID: 3042740492     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610208240039     Document Type: Article

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