EELS study of segregation-induced grain-boundary embrittlement of copper

Acta Materialia

Volumn 47, Issue 15, 1999, Pages 4009-4017

  Bruley, J ^a   Keast, V J ^b   Williams, D B ^c  

^a IBM MICROELECTRONICS   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; BISMUTH; BRITTLE FRACTURE; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; EMBRITTLEMENT; GRAIN BOUNDARIES; SEGREGATION (METALLOGRAPHY); SILVER;

GRAIN BOUNDARY EMBRITTLEMENT;

COPPER;

EID: 0033311693     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00261-X     Document Type: Article

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