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Volumn , Issue , 2004, Pages 633-636

High-Q thin-film silicon resonators processed at temperatures below 110°C on glass and plastic substrates

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISSIPATION; HYDROGENATION; MICROELECTROMECHANICAL DEVICES; MICROMACHINING; PLASTICS; RESONATORS; SUBSTRATES; THIN FILM TRANSISTORS;

EID: 3042709857     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (17)
  • 3
    • 0036530812 scopus 로고    scopus 로고
    • Thermal actuation of thin film microelectromechanical structures
    • J. Gaspar, V. Chu, N. Louro, R. Cabeça, J. P. Conde, "Thermal actuation of thin film microelectromechanical structures", J. Non-Crystalline Solids, vols. 299-302, pp. 1224-1228, 2002.
    • (2002) J. Non-crystalline Solids , vol.299-302 , pp. 1224-1228
    • Gaspar, J.1    Chu, V.2    Louro, N.3    Cabeça, R.4    Conde, J.P.5
  • 4
    • 0038803803 scopus 로고    scopus 로고
    • Electrostatic actuation of thin-film microelectromechanical structures
    • J. Gaspar, V. Chu, J. P. Conde, "Electrostatic actuation of thin-film microelectromechanical structures", J. Appl. Phys., vol. 93, pp. 10018-10029, 2003.
    • (2003) J. Appl. Phys. , vol.93 , pp. 10018-10029
    • Gaspar, J.1    Chu, V.2    Conde, J.P.3
  • 7
    • 0032620083 scopus 로고    scopus 로고
    • Amorphous and microcrystalline silicon films grown at low temperatures by radio-frequency and hot-wire chemical vapor deposition
    • P. Alpuim, V. Chu, J. P. Conde, "Amorphous and microcrystalline silicon films grown at low temperatures by radio-frequency and hot-wire chemical vapor deposition", J. Appl. Phys., vol. 86, pp. 3812-3821, 1999.
    • (1999) J. Appl. Phys. , vol.86 , pp. 3812-3821
    • Alpuim, P.1    Chu, V.2    Conde, J.P.3
  • 8
    • 0042030920 scopus 로고    scopus 로고
    • Electronic and structural properties of doped amorphous and nanocrystalline silicon deposited at low substrate temperatures by radio-frequency plasma-enhanced chemical vapor deposition
    • P. Alpuim, V. Chu, J. P. Conde, "Electronic and structural properties of doped amorphous and nanocrystalline silicon deposited at low substrate temperatures by radio-frequency plasma-enhanced chemical vapor deposition", J. Vac. Sci. Technol. A, vol. 21, pp. 1048-1054, 2003.
    • (2003) J. Vac. Sci. Technol. A , vol.21 , pp. 1048-1054
    • Alpuim, P.1    Chu, V.2    Conde, J.P.3
  • 9
    • 0001447155 scopus 로고
    • Miniaturization of tuning forks
    • W. E. Newell, "Miniaturization of tuning forks", Science, vol. 161, pp. 1320-1326, 1968.
    • (1968) Science , vol.161 , pp. 1320-1326
    • Newell, W.E.1
  • 11
    • 0036903107 scopus 로고    scopus 로고
    • Energy dissipation in submicrometer thick single crystal silicon cantilevers
    • J. Yang, T. Ono, M. Esashi, "Energy dissipation in submicrometer thick single crystal silicon cantilevers", J. Microelectromech. Syst., vol. 11, pp. 775-783, 2002.
    • (2002) J. Microelectromech. Syst. , vol.11 , pp. 775-783
    • Yang, J.1    Ono, T.2    Esashi, M.3
  • 13
    • 0035801156 scopus 로고    scopus 로고
    • Elastic properties of amorphous and nanocrystalline silicon
    • R. S. Crandall, X. Liu, "Elastic properties of amorphous and nanocrystalline silicon", Thin Solid Films, vol. 395, pp. 78-83, 2001.
    • (2001) Thin Solid Films , vol.395 , pp. 78-83
    • Crandall, R.S.1    Liu, X.2
  • 14
    • 0026224474 scopus 로고
    • Measurement of the mechanical properties of silicon microresonators
    • L. M. Zhang, D. Uttamchandani, B. Culshaw, "Measurement of the mechanical properties of silicon microresonators", Sens. Actuators A, vol. 29, pp. 79-84, 1991.
    • (1991) Sens. Actuators A , vol.29 , pp. 79-84
    • Zhang, L.M.1    Uttamchandani, D.2    Culshaw, B.3
  • 15
    • 0000018940 scopus 로고    scopus 로고
    • Thermoelastic damping in micro- and nanomechanical systems
    • R. Lifschitz, M. L. Roukes, "Thermoelastic damping in micro- and nanomechanical systems", Phys. Rev. B, vol. 61, pp. 5600-5609, 2000.
    • (2000) Phys. Rev. B , vol.61 , pp. 5600-5609
    • Lifschitz, R.1    Roukes, M.L.2
  • 17
    • 0042760419 scopus 로고    scopus 로고
    • Measurement of mechanical response and losses in nanometer scale silicon wires
    • D. W. Carr, S. Evoy, L. Sekaric, H. G. Craighead, J. M. Parpia, "Measurement of mechanical response and losses in nanometer scale silicon wires", Appl. Phys. Lett., vol. 75, pp. 920-922, 1999.
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 920-922
    • Carr, D.W.1    Evoy, S.2    Sekaric, L.3    Craighead, H.G.4    Parpia, J.M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.