A method for parameter extraction of analog sine-wave signals for mixed-signal built-in-self-test applications

Proceedings - Design, Automation and Test in Europe Conference and Exhibition

Volumn 1, Issue , 2004, Pages 298-303

  Vázquez, Diego ^a   Leger, Gildas ^a   Huertas, Gloria ^a   Rueda, Adoración ^a   Huertas, José L ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE SEVILLA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPUTER HARDWARE; DIGITAL TO ANALOG CONVERSION; ENCODING (SYMBOLS); MICROELECTRONICS; MODULATORS; PARAMETER ESTIMATION; PHASE SHIFT; SIGNAL PROCESSING; WAVE FILTERS; BUILT-IN SELF TEST; PARAMETER EXTRACTION;

BUILT-IN-SELF-TEST (BIST) APPLICATIONS; COMPLEX PROCESSING; ON-CHIP IMPLEMENTATION; PARAMETER EXTRACTION;

FEATURE EXTRACTION; EXHIBITIONS;

DIGITAL DOMAIN; MIXED SIGNAL; ON-CHIP IMPLEMENTATIONS; SINE-WAVE SIGNALS;

EID: 3042611837     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. K. Arabi and B. Kaminska. "Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method". IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol.16, no. 7, July 1997.
2. G. Huertas, D. Vázquez, E. J. Peralías, A. Rueda and J. L. Huertas , "Practical Oscillation-Based Test of Integrated Filters", IEEE Design & Test of Computers, Vol 19, No 6, pp. 64-72, 2002.
3. M.V. Mahoney, "DSP-Based Testing of Analog and Mixed-Signal Circuits", IEEE Computer Society Press, 1987.
4. B.Dufort and G.W.Roberts, "On-Chip Analog Signal Generation for Mixed-Signal Built-In-Self-Test", IEEE Journal of Solid-State Circuits, Vol. 33, No. 3, pp. 318-330, March 1990.
5. H.C. Hong, J.L. Huang, K.T. Cheng, C.W. Wu, D.M. Kwai: "Practical Considerations in Applying ΣΔ Modulation-Based Analog BIST to Sampled-Data Systems" IEEE Trans. on Circuits and Systems-II, Vol. 50, no. 9, pp. 553-566, September 2003
6. D. Vazquez, G. Huertas, G. Leger, E. Peralias, A. Rueda, J.L. Huertas: "On-Chip Evaluation of Oscillation Based Test Output Signals for Switched-Capacitor Circuits", Int. Journ of Analog Integrated Circuits and Signal Processing, vol. 33, pp.201-211, 2002
7. P.Malcovati, S.Brigati, F.Francesconi, F.Maloberti, P.Cusinato and A.Baschirotto: "Behavioral Modeling of Switched-Capacitor Sigma-Delta Modulators", IEEE Trans. on Circuits and Systems-I, Vol. 50, NO. 3, March 2003.