On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits

Analog Integrated Circuits and Signal Processing

Volumn 33, Issue 2, 2002, Pages 201-211

  Vázquez, Diego ^a   Huertas, Gloria ^a   Leger, Gildas ^a   Peralías, Eduardo ^a   Rueda, Adoración ^a   Luis Huertas, José ^a  

^a UNIVERSITY OF SEVILLE   (Spain)

Author keywords

Analog testing; On chip evaluation of test signals; Oscillation based test (OBT); Oversampling modulators; Test interpretation

Indexed keywords

BUILT-IN SELF TEST; CAPACITORS; CIRCUIT OSCILLATIONS; FEATURE EXTRACTION; LINEAR INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; MODULATORS; STANDARDIZATION; SWITCHING CIRCUITS;

ANALOG TEST; OSCILLATION BASED TEST TECHNIQUE; OVERSAMPLING MODULATORS;

INTEGRATED CIRCUIT TESTING;

EID: 0036855617     PISSN: 09251030     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021276218012     Document Type: Article

References (9)

1. Arabi, K. and Kaminska, B., "Oscillation-test strategy for analog and mixed-signal integrated circuits." VLSI Test Symposium, pp. 476-482, 1996.
2. Arabi, K. and Kaminska, B., "Testing analog and mixed-signal integrated circuits using oscillation-test method." Trans. on Comp.-Aided Design of Int. Circ. and Sys. 16(7), July 1997.
3. Arabi, K. and Kaminska, B., "Oscillation-test methodology for low-cost testing of active analog filters." Trans. on Instrum. and Meas. 48(4), pp. 798-806, August 1999.
4. Hassan, IHS, Arabi, K. and Kaminska, B., "Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation." Int. Conf. on Comp. Design (ICCD 98), October 1998.
5. Huertas, G., Vazquez, D., Rueda, A. and Huertas, J. L., "Oscillation-based test experiments in filters: A DTMF example." Int. Mixed-Signal Test Workshop, Whistler, pp. 249-253, June 1999.
6. Huertas, G., Vazquez, D., Rueda, A. and Huertas, J. L., "Effective oscillation-based test for application to a DTMF filter bank," in Proc. IEEE Int. Test Conf., pp. 549-555, September 1999.
7. Huertas, G., Vazquez, D., Rueda, A. and Huertas, J. L., "Practical methods for reading test outcomes in oscillation-based test." Int. Mixed-Signal Test Workshop, June 2000.
8. Roh, J. and Abraham, J., "A comprehensive TDM comparator scheme for effective analysis of oscillation-based test." Proc. IEEE VTS, pp. 143-148, April 2000.
9. Norsworthy, S., Schreier, R. and Temes, G., "Delta-sigma data converters." IEEE Press, 1997.