메뉴 건너뛰기




Volumn 19, Issue 6, 2002, Pages 64-72

Practical oscillation-based test of integrated filters

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FILTERS; ANALOG TO DIGITAL CONVERSION; APPLICATION SPECIFIC INTEGRATED CIRCUITS; CAPACITORS; CIRCUIT OSCILLATIONS; PARAMETER ESTIMATION;

EID: 0036859047     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2002.1047745     Document Type: Article
Times cited : (59)

References (12)
  • 1
    • 0029721649 scopus 로고    scopus 로고
    • Oscillation-test strategy for analog and mixed-signal integrated circuits
    • IEEE CS Press, Los Alamitos, Calif.
    • K. Arabi and B. Kaminska, "Oscillation-Test Strategy for Analog and Mixed-Signal Integrated Circuits," Proc. 14th VLSI Test Symp. (VTS 96), IEEE CS Press, Los Alamitos, Calif., 1996, pp. 476-482.
    • (1996) Proc. 14th VLSI Test Symp. (VTS 96) , pp. 476-482
    • Arabi, K.1    Kaminska, B.2
  • 2
    • 0031177505 scopus 로고    scopus 로고
    • Testing analog and mixed-signal integrated circuits using oscillation-test method
    • July
    • K. Arabi and B. Kaminska, "Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 16, no. 7, July 1997, pp. 745-753.
    • (1997) IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems , vol.16 , Issue.7 , pp. 745-753
    • Arabi, K.1    Kaminska, B.2
  • 3
    • 0030709776 scopus 로고    scopus 로고
    • Design of oscillation-based test structures for active RC filters
    • IEEE CS Press, Los Alamitos, Calif.
    • M. Santo-Zarnik, F. Novak, and S. Macek, "Design of Oscillation-Based Test Structures for Active RC Filters," Proc. European Design & Test Conf. (EDTC 97), IEEE CS Press, Los Alamitos, Calif., 1997, pp. 618-624.
    • (1997) Proc. European Design & Test Conf. (EDTC 97) , pp. 618-624
    • Santo-Zarnik, M.1    Novak, F.2    Macek, S.3
  • 4
    • 0033362293 scopus 로고    scopus 로고
    • Oscillation-test methodology for low-cost testing of active analog filters
    • Aug.
    • K. Arabi and B. Kaminska, "Oscillation-Test Methodology for Low-Cost Testing of Active Analog Filters," IEEE Trans. Instrumentation and Measurement, vol. 48, no. 4, Aug. 1999, pp. 798-806.
    • (1999) IEEE Trans. Instrumentation and Measurement , vol.48 , Issue.4 , pp. 798-806
    • Arabi, K.1    Kaminska, B.2
  • 5
    • 0002220153 scopus 로고    scopus 로고
    • Oscillation-based test experiments in filters: A DTMF example
    • IEEE CS Press, Los Alamitos, Calif.
    • G. Huertas et al., "Oscillation-Based Test Experiments in Filters: A DTMF Example," Proc. 5th IEEE Int'l Mixed-Signal Test Workshop, IEEE CS Press, Los Alamitos, Calif., 1999, pp. 249-253.
    • (1999) Proc. 5th IEEE Int'l Mixed-Signal Test Workshop , pp. 249-253
    • Huertas, G.1
  • 6
    • 0033309293 scopus 로고    scopus 로고
    • Effective oscillation-based test for application to a DTMF filter bank
    • IEEE Press, Piscataway, N.J.
    • G. Huertas et al., "Effective Oscillation-Based Test for Application to a DTMF Filter Bank," Proc. Int'l Test Conf. (ITC 99), IEEE Press, Piscataway, N.J., 1999, pp. 549-555.
    • (1999) Proc. Int'l Test Conf. (ITC 99) , pp. 549-555
    • Huertas, G.1
  • 7
    • 0036859706 scopus 로고    scopus 로고
    • Testing mixed-signal cores: Practical oscillation-based test in an analog macrocell
    • Nov.-Dec.
    • G. Huertas et al., "Testing Mixed-Signal Cores: Practical Oscillation-Based Test in an Analog Macrocell," IEEE Design & Test of Computers, vol. 19, no. 6, Nov.-Dec. 2002, pp. 73-82.
    • (2002) IEEE Design & Test of Computers , vol.19 , Issue.6 , pp. 73-82
    • Huertas, G.1
  • 9
    • 0018739585 scopus 로고
    • A family of active switched capacitor biquad building blocks
    • Dec.
    • P.E. Fleischer and K.R. Laker, "A Family of Active Switched Capacitor Biquad Building Blocks," Bell System Technology J., vol. 58, Dec. 1979, pp. 2235-2269.
    • (1979) Bell System Technology J. , vol.58 , pp. 2235-2269
    • Fleischer, P.E.1    Laker, K.R.2
  • 10
    • 0141931127 scopus 로고
    • Dept. Electrical Eng. and Center for Telecommunications Research, Columbia Univ., New York
    • Users' Manual for SWITCAP2 Version 1.1, Dept. Electrical Eng. and Center for Telecommunications Research, Columbia Univ., New York, 1992.
    • (1992) Users' Manual for SWITCAP2 Version 1.1
  • 11
    • 0011852492 scopus 로고    scopus 로고
    • Cadence Design Systems, San Jose, Calif.
    • Spectre User Guide, Version 4.4.1, Cadence Design Systems, San Jose, Calif., 1997.
    • (1997) Spectre User Guide, Version 4.4.1
  • 12
    • 0030651838 scopus 로고    scopus 로고
    • SWlTTEST: Automatic switch-level fault simulation and test evaluation of switched-capacitor systems
    • ACM Press, New York
    • S. Mir et al., "SWlTTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems," Proc. 34th Design Automation Conf. (DAC 97), ACM Press, New York, 1997, pp. 281-286.
    • (1997) Proc. 34th Design Automation Conf. (DAC 97) , pp. 281-286
    • Mir, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.