Practical considerations in applying Σ-Δ modulation-based analog BIST to sampled-data systems

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 50, Issue 9, 2003, Pages 553-566

  Hong, Hao Chiao ^a   Huang, Jiun Lang ^b   Cheng, Kwang Ting Tim ^c   Wu, Cheng Wen ^a   Kwai, Ding Ming ^d  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c University of California   (United States)

^d Intellectual Property Library Company   (Taiwan)

Author keywords

Analog response extractor; Analog stimulus generator; Built in self test (BIST); Frequency response observation range; Multitone test; Sample data system; Sigma delta modulation; Single tone test

Indexed keywords

BUILT-IN SELF TEST; CAPACITORS; CMOS INTEGRATED CIRCUITS; COMPUTER SOFTWARE; DIGITAL TO ANALOG CONVERSION; FREQUENCY RESPONSE; FUNCTION GENERATORS; LOW PASS FILTERS; MODULATORS;

ANALOG BUILT-IN SELF TEST; ANALOG RESPONSE EXTRACTOR; ANALOG STIMULUS GENERATOR; MULTITONE TEST; SAMPLED-DATA SYSTEMS; SINGLE-TONE TEST;

DELTA SIGMA MODULATION;

EID: 0141954043     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSII.2003.814812     Document Type: Article

References (18)

1. M. L. Bushnell and V. D. Agrawal, Essentials of Electronics Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Norwell, MA: Kluwer, 2000.
2. M. F. Toner and G. W. Roberts, "A BIST scheme for an SNR, gain tracking, and frequency response test of a sigma-delta ADC," IEEE Trans. Circuits Syst. I: Fund. Theory Applicat., vol. 42, pp. 1-15, Jan. 1995.
3. C.-Y. Pan and K.-T. Cheng, "Implicit functional testing for mixed-signal circuits," in Proc. IEEE VLSI Test Symp. (VTS), 1996, pp. 489-494.
4. K. Arabi and B. Kaminska, "Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits," in Proc. Int. Test Conf. (ITC), 1997, pp. 786-795.
5. ____, "On chip testing data converters using static parameters," IEEE Trans. VLSI Syst., vol. 6, pp. 409-419, Sept. 1998.
6. A. Hajjar and G. W. Roberts, "A high speed and area efficient on-chip analog waveform extractor," in Proc. Int. Test Conf. (ITC), 1998, pp. 688-697.
7. B. Dufor and G. W. Roberts, "On-chip analog signal generation for mixed-signal built-in self-test," IEEE J. Solid-State Circuits, vol. 34, pp. 318-330, Mar. 1999.
8. M. Hafed and G. W. Roberts, "A stand-alone integrated excitation/extraction system for analog BIST applications," in Proc. IEEE Custom Integrated Circuits Conf. (CICC), 2000, pp. 83-86.
9. M. Hafed, N. Abaskharoun, and G. W. Roberts, "A stand-alone integrated test core for time and frequency domain measurements," in Proc. Int. Test Conf. (ITC), 2000, pp. 1031-1040.
10. J.-L. Huang and K.-T. Cheng, "Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis," in Proc. Int. Test Conf. (ITC), 2000, pp. 1021-1030.
11. J.-L. Huang and K.-T. Cheng, "A sigma-delta modulation based BIST scheme for mixed-signal circuits," in Proc. Asia and South Pacific Design Automation Conf. (ASPDAC), 2000, pp. 605-610.
12. K. Lofstrom, "Early capture for boundary scan timing measurements," in Proc. Int. Test Conf. (ITC), 1996, pp. 417-422.
13. H.-C. Hong, B.-H. Lin, and C.-W. Wu, "Analysis and design of multiple-bit high-order Σ-Δ modulator," in Proc. Asia and South Pacific Design Automation Conf. (ASPDAC), 1997, pp. 419-424.
14. A. V. Oppenheim and R. W. Schafer, Discrete-Time Signal Processing. Englewood Cliffs, NJ: Prentice-Hall, 1989.
15. T.-H. Kuo, K.-D. Chen, and J.-R. Chen, "Automatic coefficients design for high-order sigma-delta modulators," IEEE Trans. Circuits Syst. II: Analog Digital Signal Process., vol. 46, pp. 6-15, Jan. 1999.
16. R. M. Gray, "Spectral analysis of quantization noise in a single-loop sigma-delta modulator with dc input," IEEE Trans. Commun., vol. 37, pp. 588-599, June 1989.
17. S.R. Northworthy, "Optimal nonrecursive noise shaping filters for over-sampling data converters-Part 1: Theory," in Proc. IEEE Int. Symp. Circuits and Systems (ISCAS), 1993, pp. 1353-1356.
18. K. R. Laker and W. M. C. Sansen, Design of Analog Integrated Circuits and Systems. New York: McGraw-Hill, 1994.