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Volumn 14, Issue 6, 2004, Pages 806-813

A vertical convex corner compensation and non {111} crystal planes protection for wet anisotropic bulk micromachining process

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL STRUCTURE; DOPING (ADDITIVES); MICROELECTROMECHANICAL DEVICES; REACTIVE ION ETCHING; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON WAFERS; THIN FILMS;

EID: 3042608191     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/14/6/007     Document Type: Article
Times cited : (15)

References (15)
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    • Micromachining of silicon mechanical structures
    • Kaminsky G 1985 Micromachining of silicon mechanical structures J. Vac. Sci. Technol. B 3 1015-24
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  • 3
    • 0032804851 scopus 로고    scopus 로고
    • Free-space fiber-optic switches based on MEMS vertical torsion mirrors
    • Lee S S, Huang L S, Kim C J and Wu M C 1999 Free-space fiber-optic switches based on MEMS vertical torsion mirrors J. Lightwave Technol. 17 7-13
    • (1999) J. Lightwave Technol. , vol.17 , pp. 7-13
    • Lee, S.S.1    Huang, L.S.2    Kim, C.J.3    Wu, M.C.4
  • 4
    • 0032649155 scopus 로고    scopus 로고
    • Electromagnetic torsion mirrors for self-aligned fiber-optic crossconnectors by silicon micromachining
    • Toshiyoshi H, Miyauchi D and Fujita H 1999 Electromagnetic torsion mirrors for self-aligned fiber-optic crossconnectors by silicon micromachining IEEE J. Sel. Top. Quantum Electron. 5 10-17
    • (1999) IEEE J. Sel. Top. Quantum Electron. , vol.5 , pp. 10-17
    • Toshiyoshi, H.1    Miyauchi, D.2    Fujita, H.3
  • 5
    • 0018030427 scopus 로고
    • Anisotropic etching of silicon
    • Beam K E 1978 Anisotropic etching of silicon IEEE Trans. Electron Devices 25 1185-93
    • (1978) IEEE Trans. Electron Devices , vol.25 , pp. 1185-1193
    • Beam, K.E.1
  • 7
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    • Compensation structures for convex corner micromachining in silicon
    • Puers B and Sansen W 1990 Compensation structures for convex corner micromachining in silicon Sensors Actuators A 21-23 1036-42
    • (1990) Sensors Actuators A , vol.21-23 , pp. 1036-1042
    • Puers, B.1    Sansen, W.2
  • 9
    • 0029323430 scopus 로고
    • Effects of (110)-oriented corner compensation structures on membrane quality and convex corner integrity in (100)-silicon using aqueous KOH
    • van Kampen R P and Wolffenbuttel R F 1995 effects of (110)-oriented corner compensation structures on membrane quality and convex corner integrity in (100)-silicon using aqueous KOH J. Micromech. Microeng. 5 91-4
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 91-94
    • Van Kampen, R.P.1    Wolffenbuttel, R.F.2
  • 11
    • 0035765672 scopus 로고    scopus 로고
    • Toward the micromachined vibrating gyroscope using (111) silicon wafer process
    • Hsieh J, Chen W-J and Fang W 2001 Toward the micromachined vibrating gyroscope using (111) silicon wafer process Proc. SPIE (San Francisco, CA, Oct. 2001) 4557 pp 40-8
    • (2001) Proc. SPIE (San Francisco, CA, Oct. 2001) , vol.4557 , pp. 40-48
    • Hsieh, J.1    Chen, W.-J.2    Fang, W.3
  • 12
    • 0036734075 scopus 로고    scopus 로고
    • A boron etch-stop assisted lateral silicon etching process for improved high-aspect-ratio silicon micromachining and its applications
    • Hsieh J and Fang W 2002 A boron etch-stop assisted lateral silicon etching process for improved high-aspect-ratio silicon micromachining and its applications J. Micromech. Microeng. 12 574-81
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    • Hsieh, J.1    Fang, W.2
  • 14
    • 0030230992 scopus 로고    scopus 로고
    • Determining mean and gradient residual stresses in thin film using micromachined cantilevers
    • Fang W and Wickert J A 1996 Determining mean and gradient residual stresses in thin film using micromachined cantilevers J. Micromech. Microeng. 6 301-9
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    • Fang, W.1    Wickert, J.A.2
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    • Resonant silicon accelerometers in bulk micromachining technology - An approach
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.