SCOPUS 정보 검색 플랫폼

Computational and Experimental Methods

Volumn 7, Issue , 2003, Pages 317-331

A new X-ray method for residual stress evaluation in coatings

(8) Gelfi, M a Bontempi, E a Rigato, V b Patelli, A b Guizzi, A a Roberti, R a Tosti, M c Depero, L E a

a UNIVERSITY OF BRESCIA (Italy)

b LABORATORI NAZIONALI DI LEGNARO (Italy)

c SPIN Sri S Casciano VP(Fi) (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION RESISTANCE; INDENTATION; MICROSTRUCTURE; PROTECTIVE COATINGS; REFLECTOMETERS; SCANNING ELECTRON MICROSCOPY; STRESS ANALYSIS; TRANSITION METALS; X RAY DIFFRACTION;

COATING MICROSTRUCTURE; MECHANICAL BEHAVIOUR; SURFACE COATINGS; X-RAY RESIDUAL STRESS CALCULATION;

RESIDUAL STRESSES;

EID: 3042547038 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (2)

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