Synchrotron radiation glancing incidence X-ray diffraction: A tool for structural investigations of ion implanted glasses

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 147, Issue 1-4, 1999, Pages 416-421

  Zontone, Federico ^a   D'Acapito, Francesco ^a   Gonella, Francesco ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

Ion implantation; Metallic clusters; X ray diffraction

Indexed keywords

COPPER; CRYSTAL STRUCTURE; FUSED SILICA; INTERFACES (MATERIALS); ION IMPLANTATION; LATTICE CONSTANTS; NICKEL; SYNCHROTRON RADIATION;

CRYSTALLINE PHASE; GLANCING INCIDENCE; METALLIC CLUSTER;

X RAY DIFFRACTION;

EID: 0032740690     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)90569-9     Document Type: Article

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