Anisotropy in periodic mesoporous silica and organosilica films studied by generalized ellipsometry

Applied Physics Letters

Volumn 87, Issue 24, 2005, Pages 1-3

  Peiris, F C ^a,b   Hatton, B D ^a   Ozin, G A ^a   Perovic, D D ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b KENYON COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MESOPOROUS SILICA; ORGANOSILICA THIN FILMS;

ANISOTROPY; BIREFRINGENCE; ELLIPSOMETRY; POROSITY; SILICA; THIN FILMS;

MESOPOROUS MATERIALS;

EID: 30344451698     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2140472     Document Type: Article

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