Anisotropy of optical properties of conjugated polymer thin films by spectroscopic ellipsometry

Journal of Applied Physics

Volumn 94, Issue 8, 2003, Pages 4923-4929

  Losurdo, Maria ^a   Bruno, Giovanni ^a   Irene, Eugene A ^b  

^a CNR   (Italy)

^b University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ELLIPSOMETRY; NATURAL FREQUENCIES; ORGANIC POLYMERS; PHOTONS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS;

ENERGY DISPERSION;

THIN FILMS;

EID: 0242272432     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1610236     Document Type: Article

References (26)

1. J. H. Burroughes, D. D. C. Bradley, A. R. Brown, R. N. Marks, K. Mackay, R. H. Friend, P. L. Burns, and A. B. Holmes, Nature (London) 347, 539 (1990).
2. D. Braun and A. J. Heeger, Appl. Phys. Lett. 58, 1982 (1991).
3. G. Yu, J. Gao, J. C. Hummelen, F. Wudl, and A. J. Heeger, Science 270, 1789 (1995).
4. J. H. Schön, A. Dodabalapur, C. Kloc, and B. Batlogg, Science 290, 963 (2000).
5. A. R. Brown, A. Pomp, C. M. Hart, and D. M. de Leeuw, Science 270, 972 (1995).
6. F. Garnier, R. Hajlaoui, A. Yassar, and P. Srivastava, Science 265, 1684 (1994).
7. N. C. Greenham, R. H. Friend, and D. D. C. Bradley, Adv. Mater. (Weinheim, Ger.) 6, 491 (1994).
8. C. W. Y. Law, K. S. Wong, Z. Yang, L. E. Horsurgh, and A. P. Monkman, Appl. Phys. Lett. 76, 1416 (2000).
9. M. Tammer, L. Horsburgh, A. P. Monkman, W. Brown, and H. Burrows, Adv. Funct. Mater. 12, 447 (2002).
10. M. Tammer and A. P. Monkman, Adv. Mater. (Weinheim, Ger.) 14, 210 (2002).
11. E. K. Miller, C. Y. Yang, and A. J. Heeger, Phys. Rev. B 62, 6889 (2000).
12. M. Tammer, R. W. T. Higgins, and A. P. Monkman, J. Appl. Phys. 91, 4010 (2002).
13. D. McBranch, I. H. Campbell, D. L. Smith, and J. P. Ferraris, Appl. Phys. Lett. 66, 1175 (1995).
14. R. Burzynski, P. N. Prasad, and F. E. Karasz, Polymer 31, 627 (1990).
15. D. McBranch, I. H. Campbell, D. L. Smith, and J. P. Ferraris, Appl. Phys. Lett 66, 1175 (1995).
16. R. L. Jones, S. K. Kumar, D. L. Ho, R. M. Briber, and T. P. Russel, Nature (London) 400, 1175 (1999).
17. H. G. Tompkins, A User's Guide to Ellipsometry (Academic, San Diego, CA, 1993).
18. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1989).
19. H. G. Tompkins, S. Smith, and D. Convey, Surf. Interface Anal. 29, 845 (2000).
20. W. M. Prest and D. J. Luca, J. Appl. Phys. 50, 6067 (1979); 51, 5170 (1980).
21. W. M. Prest and D. J. Luca, J. Appl. Phys. 50, 6067 (1979); 51, 5170 (1980).
22. J. Cornil, D. A. dos Santos, X. Crispin, and R. Silbey, J. Am. Chem. Soc. 120, 1289 (1998).
23. T. Thiemann, D. Ohira, K. Arima, T. Sawada, S. Mataka, F. Marken, R. G. Compton, S. Bull, and S. G. Davies, J. Phys. Org. Chem. 13, 648 (2000).
24. V. N. Bliznyuk, S. A. Carter, J. C. Scott, G. Klarner, R. D. Miller, and D. C. Miller, Macromolecules 32, 361 (1999).
25. D. Comoretto, G. Dellepiane, F. Marabelli, J. Cornil, D. A. dos Santos, J. L. Bredas, and D. Moses, Phys. Rev. B 62, 10173 (2000).
26. E. K. Miller, G. S. Maskel, C. Y. Yang, and A. J. Heeger, Phys. Rev. B 60, 8028 (1999).