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Volumn 206, Issue 24, 2005, Pages 2483-2489

Nanoporous SiLK® dielectric films prepared from free-radical graft polymerization and thermolysis

Author keywords

Dielectric properties; Graft copolymers; Nanotechnology; XPS

Indexed keywords

CROSSLINKING; DIELECTRIC FILMS; DIELECTRIC PROPERTIES; GRAFT COPOLYMERS; NANOTECHNOLOGY; PERMITTIVITY; SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 30144446171     PISSN: 10221352     EISSN: None     Source Type: Journal    
DOI: 10.1002/macp.200500371     Document Type: Article
Times cited : (7)

References (20)
  • 2
    • 0002845945 scopus 로고    scopus 로고
    • R. Havemann, J. Schmitz, H. Komiyama, K. Tsubouchi, Eds., Materials Research Society, Pittsburgh, PA
    • M. T. Bohr, in: "Advanced Metallization and Interconnect Systems for ULSI Applications", R. Havemann, J. Schmitz, H. Komiyama, K. Tsubouchi, Eds., Materials Research Society, Pittsburgh, PA 1996, pp. 3-10.
    • (1996) Advanced Metallization and Interconnect Systems for ULSI Applications , pp. 3-10
    • Bohr, M.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.