Time-domain and lock-in rate-window photocarrier radiometric measurements of recombination processes in silicon

Journal of Applied Physics

Volumn 98, Issue 12, 2005, Pages

  Mandelis, Andreas ^a,b   Pawlak, Micha ^a   Wang, Chinhua ^b   Delgadillo Holtfort, Isabel ^a   Pelzl, Josef ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b DEPARTMENT OF MECHANICAL AND INDUSTRIAL ENGINEERING   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOCARRIER RADIOMETRY (PCR); PHOTOCARRIERS; RECOMBINATION VELOCITIES;

BOUNDARY VALUE PROBLEMS; DIFFUSION; PROBLEM SOLVING; RADIOMETRY; SIGNAL TO NOISE RATIO; TIME DOMAIN ANALYSIS; TRANSPORT PROPERTIES;

SILICON WAFERS;

EID: 29744438228     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2148631     Document Type: Review

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