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Volumn 72, Issue 23, 2005, Pages

Oxide-trap-enhanced Coulomb energy in a metal-oxide-semiconductor system

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EID: 29744437019     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.235417     Document Type: Article
Times cited : (25)

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