|
Volumn 30, Issue 23, 2005, Pages 3120-3122
|
Response of a SiC photodiode to extreme ultraviolet through visible radiation
c
SFA INC
(United States)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHARGE COLLECTION EFFICIENCY (CCE);
EXTREME ULTRAVIOLET (EUV) REGION;
VISIBLE-LIGHT SENSITIVITY;
X-RAY ABSORPTION;
ELECTROMAGNETIC WAVE ABSORPTION;
ENERGY GAP;
SILICON CARBIDE;
SYNCHROTRON RADIATION;
ULTRAVIOLET RADIATION;
X RAYS;
PHOTODIODES;
|
EID: 29444449283
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.30.003120 Document Type: Article |
Times cited : (39)
|
References (14)
|