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Volumn 4139, Issue , 2000, Pages 1-7
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Responsivity model for a silicon photodiode in the extreme ultraviolet
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC FIELDS;
ELECTROMAGNETIC WAVE ABSORPTION;
PHOTODIODES;
RADIATION DAMAGE;
REFLECTOMETERS;
SEMICONDUCTING SILICON;
ULTRAVIOLET RADIATION;
ELECTROMAGNETIC FIELD STRENGTH;
TRANSMITTANCE;
PHOTODETECTORS;
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EID: 0034469101
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.410511 Document Type: Conference Paper |
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Times cited : (8)
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References (20)
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