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Volumn 5379, Issue , 2004, Pages 67-75

Forbidden area avoidance with spacing technique for layout optimization

Author keywords

Layout optimization; Photolithography; Resolution enhancement technique; Subresolution assist features

Indexed keywords

OPTICAL RESOLVING POWER; OPTIMIZATION; PHASE SHIFT; PROBLEM SOLVING; QUADRATIC PROGRAMMING; ROBUSTNESS (CONTROL SYSTEMS);

EID: 2942640096     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.533640     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 3
    • 0033713396 scopus 로고    scopus 로고
    • Lithographic comparison of assist feature design strategies
    • Christopher J. Progler, Proceedings of SPIE
    • Scott M. Mansfield, Lars W. Liebmann, Antoinette F. Molless, Alfred K Wong, "Lithographic comparison of assist feature design strategies", Optical Microlithography XIII, Christopher J. Progler, Proceedings of SPIE, Vol. 4000, pp. 63-76, 2000.
    • (2000) Optical Microlithography XIII , vol.4000 , pp. 63-76
    • Mansfield, S.M.1    Liebmann, L.W.2    Molless, A.F.3    Wong, A.K.4
  • 10
    • 0021120760 scopus 로고
    • Corner stitching: A data structuring technique for VLSI layout tools
    • January
    • John K. Ousterhout, "Corner stitching: a data structuring technique for VLSI layout tools", IEEE Transactions on Computer-Aided Design, Vol. CAD-3, No. 1, pp. 87-100, January 1984.
    • (1984) IEEE Transactions on Computer-aided Design , vol.CAD-3 , Issue.1 , pp. 87-100
    • Ousterhout, J.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.