Atomic structure of defects in GaN:Mg grown with Ga polarity

Materials Research Society Symposium - Proceedings

Volumn 798, Issue , 2003, Pages 711-722

  Liliental Weber, Z ^a   Tomaszewicz, T ^a   Zakharov, D ^a   Jasinski, J ^a   O'Keefe, M A ^a   Hautakangas, S ^b   Laakso, A ^b   Saarinen, K ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; CRYSTALLOGRAPHY; DEFECTS; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM GROWTH; GALLIUM NITRIDE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTAL POLARITY; CRYSTALLOGRAPHIC DIRECTIONS; SUBLATTICES;

CRYSTALLINE MATERIALS;

EID: 2942633294     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-798-y9.7     Document Type: Conference Paper

References (21)

1. U. Kaufman, P. Schlotter, H. Obloch, K. Kohler, M. Maier, Phys. Rev. B62, 10867 (2002).
2. S. Nakamura and G. Fasol, "The blue laser diode" (Springer-Verlag, Berlin (1997).
3. Z.Liliental-Weber, M. Benamara, J. Washburn, et al, Phys. Rev. Letter. 82, 2370 (1999).
4. Z. Liliental-Weber, M. Benamara, W. Swider, J. Washburn, I. Grzegory, S. Porowski, R.D. Dupuis, and C.J. Eiting, Physica B 273-274, 124 (1999).
5. Z. Liliental-Weber, M. Benamara, J. Washburn, I. Grzegory, S. Porowski, D.J.H. Lambert, C.J. Eiting, and R.D. Dupuis, Appl. Phys. Lett. 75, 4159 (1999).
6. Z. Liliental-Weber, J. Jasinski, M. Benamara, I. Grzegory, S. Porowski, D.J.H. Lambert, C.J. Eiting, and R.D. Dupuis, Phys. Stat. Sol. (b) 228, No. 2, 345 (2001).
7. P. Vennegues, M. Benaissa, S. Dalmaso, M. Leroux, E. Feltin, P. De Mierry, B. Beaumont, B. Damilano, N. Grandjean, and P. Gibbar, Mat. Science and Engin. B93, 224 (2002).
8. R. Kroger, S. Figge, T. Bottcher, P.L. Ryder, and D. Hommel. Mat. Res. Symp. Proc. 693, 615 (2002).
9. J.M. Cowley and S. Iijima, Z. Naturforsch., 27a, 445 (1972).
10. M.A. O'Keefe, Ultramicroscopy 47, 282 (1992).
11. A. Thust, W.M.J. Coene, M. Op De Beeck, and D. Van Dyck, Ultramicroscopy 64, 211 (1996).
12. D. Van Dyck and M. Op De Beeck, Ultramicroscopy 64, 99 (1996).
13. W. Sinkler and L. D. Marks Ultramicroscopy 75, 251 (1999).
14. M.A. O'Keefe and R. Kilaas, Scanning Microscopy suppl. 2, 225 (1988)
15. S. Porowski, M. Bockowski, B. Lucznik, et al, Acta Phys. Pol. A92, 958 (1997).
16. C.J. Eiting, P.A. Grudkowski, J.S. Park, et al J. Electr. Soc. 144, L219 (1997).
17. D.P. Bour, H.F. Chung, W. Gotz, L. Romano et al, Mater. Res. Soc. Symp. 449, 509 (1997).
18. S. Hautaakangas, J. Oila, M. Alatalo, K. Saarinen, L. Liszkay, D. Seghier, and H.P. Gislason, Phys. Rev. Lett. 90, No. 13, 137402, (2003).
19. J.E. Northrup, Appl. Phys. Lett. 82, 2278 (2003).
20. L.T. Romano, J.E. Northrup, A.J. Ptak, and T.H. Myears, Appl. Phys. Lett. 77, 2479 (2000).
21. M. Leroux, P. Vennegues, S. Dalmasso, M. Benaissa, et al. Phys. Stat. Sol. 192, 394 (2002).