Structural, dielectric and optical properties of Ba(Ti, Zr)O3 thin films prepared by chemical solution deposition

Thin Solid Films

Volumn 460, Issue 1-2, 2004, Pages 227-231

  Tang, X G ^a   Chan, H L W ^a   Ding, A L ^b  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

BTZ thin films; Dielectric properties; Ellipsometry; Optical properties

Indexed keywords

BARIUM COMPOUNDS; DEPOSITION; ELLIPSOMETRY; MOLECULAR STRUCTURE; REFRACTIVE INDEX; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

BTZ THIN FILMS; CHEMICAL SOLUTION DEPOSITION; EXTINCTION COEFFICIENT; INTERFACE LAYERS;

THIN FILMS;

EID: 2942623763     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.071     Document Type: Article

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