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Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 115-118
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Disorder-induced nucleation in the nanocrystalline silicon film growth from chlorinated materials by rf plasma-enhanced chemical vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL GROWTH;
FILM GROWTH;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
PHASE TRANSITIONS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
RAMAN SPECTROSCOPY;
SILICON;
THERMAL EFFECTS;
DEPOSITION CHAMBERS;
DEPOSITION PRESSURE;
ELECTRON TEMPERATURE;
FILM DEPOSITION;
NANOSTRUCTURED MATERIALS;
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EID: 2942620499
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2004.02.033 Document Type: Conference Paper |
Times cited : (7)
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References (15)
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