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Volumn 46, Issue 4, 2001, Pages 297-304
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Preparation of transmission electron microscope specimens from FeAl and WC powders using focused-ion beam milling
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Author keywords
Composites; Focused ion beam; Intermetallic; Powder
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Indexed keywords
INTERMETALLICS;
ION BEAMS;
IRON COMPOUNDS;
METALLIC MATRIX COMPOSITES;
RESINS;
TRANSMISSION ELECTRON MICROSCOPY;
FOCUSED-ION BEAM (FIB) MILLER;
POWDER METALS;
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EID: 0035300115
PISSN: 10445803
EISSN: None
Source Type: Journal
DOI: 10.1016/S1044-5803(00)00107-8 Document Type: Article |
Times cited : (26)
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References (16)
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