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Volumn 46, Issue 4, 2001, Pages 297-304

Preparation of transmission electron microscope specimens from FeAl and WC powders using focused-ion beam milling

Author keywords

Composites; Focused ion beam; Intermetallic; Powder

Indexed keywords

INTERMETALLICS; ION BEAMS; IRON COMPOUNDS; METALLIC MATRIX COMPOSITES; RESINS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035300115     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(00)00107-8     Document Type: Article
Times cited : (26)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.