Non-radiative and radiative properties of PLD-deposited polycrystalline GaN studied by UV ps-to-ns laser pulses

Journal of Non-Crystalline Solids

Volumn 338-340, Issue 1 SPEC. ISS., 2004, Pages 460-464

  Niehus, M ^a   Sanguino, P ^a   Schwarz, R ^a   Fedorov, A ^a   Martinho, J M G ^a   Soares, M J ^b   Monteiro, T ^b   Wunsch F ^c   Kunst, M ^c  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b UNIVERSITY OF AVEIRO   (Portugal)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; ELECTRON TRAPS; EPITAXIAL GROWTH; LASER PULSES; LIGHT EMITTING DIODES; PHOTOLUMINESCENCE; PHOTOMULTIPLIERS; POLYCRYSTALLINE MATERIALS; PROBABILITY; PULSED LASER DEPOSITION; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

STREADY-STATE PHOTOLUMINESCENCE; THERMAL MISMATCH; TIME-RESOLVED PHOTOLUMINESCENCE (TRPL); TRANSIENT PHOTOCURRENTS;

GALLIUM NITRIDE;

EID: 2942532541     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2004.03.019     Document Type: Conference Paper

References (10)

1. Calleja E., Sanchez F.J., Basak D., Sanchez-Garcia M.A., Munoz E., Izpura I., Calle F., Tijero J.M.G., Sanchez-Rojas J.L., Beaumont B., Lorenzini P., Gibart P. Phys. Rev. B. 55:1997;4689.
2. Ponce F.A., Bour D.P. Nature. 386:1997;351.
3. Sanguino P., Niehus M., Koynov S., Schwarz R., Alves H., Meyer B.K. Mater. Res. Soc. Symp. Proc. 722:2002;181.
4. Kim S.T., Lee Y.J., Chung S.H., Moon D.C. Sem. Sci. Technol. 14:1999;156.
5. Eckey L., Holst J.-Ch., Maxim P., Heitz R., Hoffmann A., Broser I., Meyer B.K., Wetzel C., Mokhov E.N., Baranov P.G. Appl. Phys. Lett. 68:1996;415.
6. Niehus M., Sanguino P., Monteiro T., Soares M.J., Pereira E., Vieira M., Koynov S., Schwarz R. Solid-State Electron. 47:2003;569.
7. Seto J.Y.W. J. Appl. Phys. 46:1975;5247.
8. Iliopolos E., et al. Appl. Phys. Lett. 73:1998;375.
9. Brandt O., et al. Phys. Rev. B. 58:1998;15977.
10. Thomas D.G., Hopfield J.J., Frosch C.J. Phys. Rev. Lett. 15:1965;857.