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Volumn 137, Issue 3, 2006, Pages 138-141

Photoreflectance spectroscopy of a Ga0.62In0.38N 0.026As0.954Sb0.02/GaAs single quantum well tailored at 1.5 μm

Author keywords

A. Quantum wells; A. Semiconductors; D. Photoreflectance

Indexed keywords

OPTICAL PROPERTIES; PHASE TRANSITIONS; REFLECTION; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS;

EID: 29144524981     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2005.11.006     Document Type: Article
Times cited : (9)

References (24)
  • 4
    • 18444385104 scopus 로고    scopus 로고
    • G. Jaschke, R. Averbeck, L. Geelhaar, H. Riechert, 278 (2005) 224
    • G. Jaschke, R. Averbeck, L. Geelhaar, H. Riechert, 278 (2005) 224.
  • 18
    • 0000425719 scopus 로고
    • Modulation Spectroscopy of Semiconductors and Semiconductor Microstructures
    • T.S. Moss Elsevier Science Amsterdam
    • F.H. Pollak T.S. Moss Modulation Spectroscopy of Semiconductors and Semiconductor Microstructures Handbook on Semiconductors vol. 2 1994 Elsevier Science Amsterdam 527 635
    • (1994) Handbook on Semiconductors , vol.2 , pp. 527-635
    • Pollak, F.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.