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Volumn 48, Issue 4, 1999, Pages 323-332
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On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper
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Author keywords
Clusters; Defects; Irradiation damage; Weak beam microscopy
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Indexed keywords
IRRADIATION;
POINT DEFECTS;
TEMPERATURE;
BEAM CONVERGENCE;
CLUSTER;
CONDITION;
IRRADIATION DAMAGE;
POINT DEFECT CLUSTERS;
SMALL CLUSTERS;
SMALL POINTS;
WEAK BEAMS;
WEAK-BEAM MICROSCOPY;
WEAK-BEAM TECHNIQUE;
COPPER;
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EID: 0032832377
PISSN: 00220744
EISSN: None
Source Type: Journal
DOI: 10.1093/oxfordjournals.jmicro.a023684 Document Type: Article |
Times cited : (21)
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References (8)
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