Anisotropic elastic properties of nanocrystalline nickel thin films

Journal of Materials Research

Volumn 20, Issue 5, 2005, Pages 1186-1193

  Hurley, D C ^a   Geiss, R H ^a   Kopycinska Muller M ^a   Muller J ^a   Read, D T ^a   Wright, J E ^a   Jennett, N M ^b   Maxwell, A S ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC MICROSCOPES; ACOUSTIC SPECTROSCOPY; ANISOTROPY; ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; ELASTICITY; GRAIN BOUNDARIES; INDENTATION; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; TENSILE TESTING; THIN FILMS;

ATOMIC FORCE ACOUSTIC MICROSCOPY (AFAM); ELASTIC PROPERTIES; FILM PROPERTIES; GRAIN-BOUNDARY EFFECTS; NICKEL THIN FILM; SURFACE ACOUSTIC WAVE (SAW);

NICKEL;

EID: 29144520583     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0146     Document Type: Article

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