Dielectric constant dispersion of yttrium-doped (Ba,Sr) Ti O3 films in the high-frequency (10 kHz-67 GHz) domain

Applied Physics Letters

Volumn 87, Issue 23, 2005, Pages 1-3

  Jeong, Doo Seok ^a   Hwang, Cheol Seong ^a   Baniecki, J D ^b   Shioga, T ^b   Kurihara, K ^b   Kamehara, N ^b   Ishii, M ^b  

^a Seoul National University   (South Korea)

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DISPERSION (WAVES); ELECTRIC RESISTANCE; INDUCTANCE; YTTRIUM;

CIRCUIT CALIBRATION; CURIE-VON SCHWEIDLER DISPERSION; PARASITIC CAPACITANCES;

DIELECTRIC AMPLIFIERS;

EID: 28444473063     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2136429     Document Type: Article

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