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Volumn 41, Issue 24, 2005, Pages 1330-1331
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Reliability study of InAs/InGaAs quantum dot diode lasers
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
AGING OF MATERIALS;
OPTICAL WAVEGUIDES;
RELIABILITY;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
SEMICONDUCTOR LASERS;
ACCELERATED AGEING;
ACTIVE REGION;
RIDGE-WAVEGUIDE LASERS;
SEMICONDUCTOR QUANTUM DOTS;
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EID: 28444472429
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20053336 Document Type: Article |
Times cited : (16)
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References (6)
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