Determination of crystallographic polarity of ZnO layers

Applied Physics Letters

Volumn 87, Issue 14, 2005, Pages 1-3

  Tampo, H ^a   Fons, P ^a   Yamada, A ^a   Kim, K K ^a   Shibata, H ^a   Matsubara, K ^a   Niki, S ^a   Yoshikawa, H ^b   Kanie, H ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; X RAY DIFFRACTION ANALYSIS;

ACID ETCHING; LAYER THICKNESS; POLARITY;

ZINC OXIDE;

EID: 28344442094     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2067689     Document Type: Article

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