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Volumn 285, Issue 4, 2005, Pages 486-490
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High growth rates (>30 μm/h) of 4H-SiC epitaxial layers using a horizontal hot-wall CVD reactor
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Author keywords
A1. Crystal morphology; A3. Chemical vapor deposition processes; A3. Hot wall epitaxy; B2. Semiconducting materials
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CONCENTRATION (PROCESS);
CRYSTAL STRUCTURE;
SEMICONDUCTOR MATERIALS;
SILICON CARBIDE;
SURFACE ROUGHNESS;
X RAY DIFFRACTION ANALYSIS;
A1. CRYSTAL MORPHOLOGY;
A3. HOT-WALL EPITAXY;
EPITAXIAL GROWTH;
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EID: 28144443999
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2005.09.037 Document Type: Article |
Times cited : (64)
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References (11)
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