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Volumn 285, Issue 4, 2005, Pages 486-490

High growth rates (>30 μm/h) of 4H-SiC epitaxial layers using a horizontal hot-wall CVD reactor

Author keywords

A1. Crystal morphology; A3. Chemical vapor deposition processes; A3. Hot wall epitaxy; B2. Semiconducting materials

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CONCENTRATION (PROCESS); CRYSTAL STRUCTURE; SEMICONDUCTOR MATERIALS; SILICON CARBIDE; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

EID: 28144443999     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.09.037     Document Type: Article
Times cited : (64)

References (11)
  • 8
    • 28144431911 scopus 로고    scopus 로고
    • www.novasic.com


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.