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Volumn 87, Issue 17, 2005, Pages 1-3

High radiation tolerance of InAs/AlSb high-electron-mobility transistors

Author keywords

[No Author keywords available]

Indexed keywords

ALSB BARRIERS; CARRIER REINJECTION; SOURCE-DRAIN CURRENT;

EID: 28044437849     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2115071     Document Type: Article
Times cited : (32)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.