X-ray reflectivity, diffraction and grazing incidence small angle X-ray scattering as complementary methods in the microstructural study of sol-gel zirconia thin films

Thin Solid Films

Volumn 495, Issue 1-2, 2006, Pages 224-231

  Lenormand, P ^a   Lecomte, A ^b   Babonneau, D ^c   Dauger, A ^b  

^a INSTITUT CARNOT CIRIMAT   (France)

^b UNIVERSITY OF LIMOGES   (France)

^c UNIVERSITÉ DE POITIERS   (France)

Author keywords

Nanostructure; Sol gel coating; X ray scattering; Zirconium oxide

Indexed keywords

MICROSTRUCTURE; REFLECTOMETERS; SAPPHIRE; SOL-GELS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION; X RAY SCATTERING; ZIRCONIA;

CLOSE-PACKED MICROSTRUCTURE; GRAZING INCIDENCE; SOL-GEL COATING; X-RAY REFLECTIVITY;

THIN FILMS;

EID: 28044431636     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.08.335     Document Type: Conference Paper

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