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Volumn 124-125, Issue SUPPL., 2005, Pages 123-126
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XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(0 0 1) substrates
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Author keywords
Ge SiGe heterostructures; Reciprocal space maps (RSM); X ray diffraction (XRD)
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Indexed keywords
ANNEALING;
NONDESTRUCTIVE EXAMINATION;
SILICON;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
RECIPROCAL SPACE MAPS (RSS);
RUTHERFORD BACKSATTERING (RBS);
SOLID-SOURCE (SS);
HETEROJUNCTIONS;
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EID: 27944476985
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mseb.2005.08.087 Document Type: Conference Paper |
Times cited : (4)
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References (13)
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