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Volumn 124-125, Issue SUPPL., 2005, Pages 123-126

XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(0 0 1) substrates

Author keywords

Ge SiGe heterostructures; Reciprocal space maps (RSM); X ray diffraction (XRD)

Indexed keywords

ANNEALING; NONDESTRUCTIVE EXAMINATION; SILICON; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

EID: 27944476985     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2005.08.087     Document Type: Conference Paper
Times cited : (4)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.