A self-adjusting scheme to determine the optimum RBB by monitoring leakage currents

Proceedings - Design Automation Conference

Volumn , Issue , 2005, Pages 43-46

  Jayakumar, Nikhil ^a   Dhar, Sandeep ^b   Khatri, Sunil P ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

Body biasing; Leakage power; Self adjusting

Indexed keywords

ENERGY UTILIZATION; INTEGRATED CIRCUITS; THERMAL EFFECTS;

BODY-BIASING; LEAKAGE POWER; REVERSE BODY BIASING (RBB); SELF-ADJUSTING;

LEAKAGE CURRENTS;

EID: 27944433425     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1065579.1065595     Document Type: Conference Paper

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