Performance of submicron CMOS devices and gates with substrate biasing

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 2000, Pages IV-9-IV-12

  Liu, Xiaomei ^a,b   Mourad, Samiha ^a  

^a Santa Clara University   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LEAKAGE CURRENTS; SUBSTRATES;

SUBSTRATE BIASING;

CMOS INTEGRATED CIRCUITS;

EID: 0033682308     PISSN: 02714310     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISCAS.2000.858675     Document Type: Article

References (12)

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